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RFID testing machine

RFID testing machine

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Shenzhen CaiNa Semiconductor Equipment Co., Ltd

Shenzhen CaiNa Semiconductor Equipment Co., Ltd

China

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Persona de contacto Jocelyn

Shenzhen, Guangdong

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Description

TECHNICAL PARAMETERS SPECIFICATION:
Dimension:***0mm***0mm***0mm
Power:***0w
Barometric Pressure:0.1MPa≤P≤0.7MPa
Function: Product inspection,data R/W and chip searching,initialization.
Controller:PC
Type:Automatic
Accommodated Work piece:Antenna ≤**0mm
Label Frequency:HF*3.5M&UHF**0M ISO******6C for UHF
Efficiency:**********0Pcs/h(Depends on the testing period and the label length)
Adapted material:reeling finished electronic label and inlay

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