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RD-2700A X ray diffractometer (XRD)

RD-2700A X ray diffractometer (XRD)

50000 ~ 55000 / Set

|

Minimum Order

Place of Origin:

-

Price for Minimum Order:

Minimum Order Quantity:

1 Set

Packaging Detail:

box

Delivery Time:

3 months

Supplying Ability:

20 Set per Year

Payment Type:

T/T

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Miembro Básico

Persona de contacto Mr. Gary

NO 31-17 Central Street,New City Zone,Dandong City 118009,China, Dandong, Liaoning

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Description

RST series X ray diffractometers (XRD)  can be quickly set with a variety of accessories, with superior analytic
capabilities. X ray diffractometer is widely used for analyzing natural and synthetic inorganic and organic material, such as clay minerals, cement building materials, environment dust, chemical products, drugs, chemical products, drugs,
asbestos, rock minerals and polymer.Its designed is based on θ-θgeometrical optics, easy for sample preparation and accessory installation.
 
 
 
Application:
 
Identification for one or multiple phases of an unknown specimen;
 
Quantitative analysis for known phases of combined specimen;
 
Structure analysis for crystal;
 
Change of crystal structure of under unusual condition;
 
Film analysis for material surface;
 
Structure analysis and stress analysis for metal material.
 
 
 
 
Technical Specifications:
rated output power: 3kW
tube voltage:*0~*0kV (1kV /step)
tube current:5~*0mA (1mA /step)
tube voltage and tube current stability: ≤ 0.1‰
metal ceramic x-ray tube:2.4KW
target material: Cu, Fe, Co, Cr, Mo
focus dimension: 1x*0mm, 0.4 x*4mm, 2 x*2mm
one way repeatability of θd or θs: ≤0.***5°
sample horizontal:θ-θ
diffraction circle semi-diameter: **5mm, or made specially from **0mm to **5mm
scanning rate: 0.***2°ï½ž*0°/min
positioning speed: ***0°/min
Scanning mode: θs/θd linking action, single action,continuous,step and omg
minimal stepping angle: 0.***1°
precision of θd or θs: ≤0.**1°
2θangle linearity: National standard sample (Si, Al2o3), with the range of full spectrum, all peak angle error is not within ±0.*2°
Detector: Positive proportion or shinning (SC), silicon drifting detector (SDD), high speed one-dimensional semiconductor array detector
counting method: Differential or integral, automatic PHA,fixed time correction
energy resolution: ≤*5% (PC, one-dimentional array), ≤*0%(SC), ≤**0ev(SDD)
maximum linear counting rate: 5×**5CPS,   *5×**4CPS,9×**7CPS
system measure stability: ≤0.*1%
outer dimension: ***0×**0×**0mm
protection: over-voltage, over-current, over-power, no-voltage, break off water and X-ray tubes over-temperature protection

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A:

Mr. Gary < Liaoning Ruiland Science & Technology Co., Ltd >

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