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Persona de contacto Mr. Meng
Dongting, Tianjin, Tianjin
Type | Specification |
Total Thickness Variation (TTV) | ≤5 µm |
TIR | ≤5 µm |
WARP | ≤*0 µm |
BOW | ≤*0 µm |
Resistivity | (8×***4~*0) Ohm·cm |
Particles | ≤ *5/ wafer, ≥ 0.2µm |
Back Side Surface | Polished / LTO / Etch |
Other | SEMI Standard |
Type | Specification |
Total Thickness Variation (TTV) | ≤5 µm |
TIR | ≤5 µm |
WARP | ≤*0 µm |
BOW | ≤*0 µm |
Maximum Resistivity | ≥**4 Ohm·cm |
Oxygen Concentration | ≤1×***6 atom/cm3 |
Carbon Concentration | ≤1×***6 atom/cm3 |
Other | SEMI Standard |