AA5000

Description

Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;�
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;�
SPM can be in liquid;�
Real-time temperature and humidity detecting;�
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;�
Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;�
Fast automatically tip-engaging�
Simply change of the tip holder to switch between STM and AFM;�
Full digital control, auto system status recognition;�
Adjustable lightening inside�
With a **-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
Controller and Computer connected through a *0M/**0M Fast Ethernet;
Large sample size: up to diameter *5mm, *0mm thick;�
Online Control Software and offline Image Processing Software for Windows;�
Trace-Retrace scan, Back-Forward scan;�
Online real-time 3D image;�
Automatically Brightness and Contrast refresh;�
Data can be loaded out for further analysis;
Nano-Movie function: Continuous data collection, storage and replay;�
Multi-Analysis: Granularity and Roughness;
Tip Estimation and Image Re-construction;�
Modularized design for convenience of maintenance and future upgrade;
Second display monitor and optical microscope system attachable;