Description

Instrument introduction EDX**0 incorporates Skyray’s years of experience in precious metals testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job. EDX**0 is configured with an efficient and practical proportional counter, delivering compositions and plating thickness measurements of precious metals in a reasonable cost. The novel EDX**0 has modern outlook, structure and color design. Performance characteristics Specialized precious metals and plating thickness testing Intelligent Precious Metals Analysis Software matches perfectly with the hardware. Arbitrary optional analysis and identification models Independent matrix effect correction models Multi-variable non-linear regression procedure Technical specifications Measurable elements: Au, Ag, Cu, etc Measurement Precision (Standard Deviation Statistic): 0.*5%~0.1% ( main element content over than *6%) 0.*1um~0.*5um (for coating element analysis) Tube voltage: ***0KV Tube current: ******0Î&frac*4;A Test time: *0~**0s Ambient humidity: <=*0% Ambient temperature: 5℃**0℃ Power: AC**0V**5V( AC purified stabilized voltage power supply is recommended) Standard configurations Single sample chamber Laser positioning device Proportional counter Signal detection electronic circuit High and low voltage power supplies X-ray tube Application fields Content determination of precious metals Au, Pt, Ag, etc and jewelries Thickness measurement of metal plating and content determination of plating solutions and plating Precious metals and jewelries processing industries, banks, jewelries shops and testing centers, plating industries