Description

Manufacturer:ELECTROGLAS Refurbished by:Allwin*1 Corp The ELECTROGLAS Model ***4X Automatic Wafer Probe is a precision instrument for testing and classifying semiconductor devices in wafer form. The Model I**4X is a self-nontained system comprising two modules, a probe module and a power module. Both modules are designed for compact bench-top mounting; however, an interconnecting cable permits remote mounting of the power module when desired. The ELECTROGLAS ***4X is designed for operational simplicity and fast wafer throughput. The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. Simplified manual and semi-automatic controls assure rapid wafer alignment by automatic gross positioning, simplified theta alignment, and precise device alignment by use of a multi-function joystick that provides *0 different manual commands in a single control. The high-speed automatic probing cycle provides automatic indexing, probing and inking of all devices on the wafer under preprogrammed indexing control, and automatic return to the load position when probing is complete. The system accommodates up to *-inch (***-mm) wafers and provides indexing in either English or Metric system units. Original Electroglas EG***4X Wafer Prober key featuresïÂ&frac*4;ï¿&frac*2; Direct computer control (if the SUPER D control module is used) Wafer Size Range: 3âï¿&frac*2;³*- 6âï¿&frac*2;³ X-Y stage travel: **0mmÃï¿&frac*2;**0mm Power supply: **0V/**0VïÂ&frac*4;ï¿&frac*2;*0/*0Hz Compressed air pressure: *0 psi Power consumption: <**0W Accuracy: ±5ÃŽÂ&frac*4;m Allwin*1 Corp. can also provide Allwin*1 Corp proprietary AW Software and Allwin*1 new technologies to upgrade the refurbished EG ***4 which provides the following significant advantages. Pentium PC controller with DOS-WINDOW graphics GUI, Touchscreen optional Wafer Map data storage ****->visit our website for more