Descripción del producto

• Tight mechanical coupling yields excellent noise performance.
• Integrated with inverted optical microscopes.
• Two independent, XY and closed-loop Z scanner.
• Flat and linear XY scan of up to *0 µm × *0 µm with low residual bow.
• Accurate height measurements.
• Less tip wear for prolonged high-quality and high-resolution imaging.
• Minimized sample damage or modification.
• Immunity from parameter-dependent results observed in tapping imaging.
• Easy sample or tip exchange and Easy head removal.
• Direct on-axis optics for high resolution optical viewing.
• Back-lash free sample-stage. Sample positioning range of 7 mm in X and Y.
• Compatible with both reflection and transmission optical viewing.